A groundbreaking new method for characterizing semiconductors has been developed by an HZB physicist. Known as the “Constant Light-Induced Magneto-Transport (CLIMAT)”, this innovative technique is based on the Hall effect and has the capability to measure 14 different parameters of transport properties for both negative and positive charge carriers in a single comprehensive measurement.

Semiconductor materials play a crucial role in a wide range of electronic devices including solar cells, transistors, detectors, sensors, and LEDs. Understanding the behavior of charge carriers in semiconductors is essential for optimizing the performance of these devices. Traditionally, determining the transport properties of negative and positive charge carriers required separate measurements using different methods, which was both time-consuming and inefficient.

CLIMAT utilizes a magnetic field perpendicular to the sample along with a constant light source to induce charge separation. The movement of charge carriers under the influence of an electric field and a magnetic field results in the Hall effect, where their properties such as mass and mobility can be assessed. By analyzing the signals generated by this process, CLIMAT can provide detailed insights into the transport mechanisms of both negative and positive charge carriers simultaneously.

Validation and Recognition

The efficacy of the CLIMAT method has been demonstrated through the characterization of twelve different semiconductor materials, including silicon, halide perovskite films, and organic semiconductors. Independent experts such as Prof Vitaly Podzorov have recognized the significance of CLIMAT, awarding it high praise in publications like Nature Electronics. The method has also been approved for patenting by the European Patent Office, paving the way for potential commercialization through licensing agreements with companies.

As negotiations continue for the commercialization of CLIMAT, the potential impact of this method on the field of semiconductor research is significant. By offering a faster and more comprehensive approach to characterizing semiconductor materials, CLIMAT has the potential to accelerate the development of new optoelectronic applications such as solar cells. The vision of a compact measuring device, comparable in size to a notebook, holds promise for widespread adoption in research and industry.

The introduction of the CLIMAT method represents a significant advancement in semiconductor characterization, offering a more efficient and comprehensive approach to assessing the transport properties of charge carriers in various semiconductor materials. With its ability to streamline the evaluation of new materials for optoelectronic applications, CLIMAT is poised to revolutionize the field of semiconductor research and drive innovation in electronic device technology.


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